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      Interconnect limits on gigascale integration (GSI) in the 21st century

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          The conductivity of thin metallic films according to the electron theory of metals

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            On a Pin Versus Block Relationship For Partitions of Logic Graphs

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              Low temperature poly-Si thin-film transistor fabrication by metal-induced lateral crystallization

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                Author and article information

                Journal
                Proceedings of the IEEE
                Proc. IEEE
                Institute of Electrical and Electronics Engineers (IEEE)
                00189219
                March 2001
                : 89
                : 3
                : 305-324
                Article
                10.1109/5.915376
                cbb90f6b-70df-42f8-902f-70fa59a8336c
                History

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