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      High-resolution Z-contrast imaging of crystals

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      Ultramicroscopy

      Elsevier BV

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          Most cited references 59

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          Stabilities of single-layer and bilayer steps on Si(001) surfaces

           D Chadi (1987)
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            Relativistic Hartree–Fock X-ray and electron scattering factors

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              Observation of Order-Disorder Transitions in Strained-Semiconductor Systems

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                Author and article information

                Journal
                Ultramicroscopy
                Ultramicroscopy
                Elsevier BV
                03043991
                August 1991
                August 1991
                : 37
                : 1-4
                : 14-38
                Article
                10.1016/0304-3991(91)90004-P
                © 1991

                http://www.elsevier.com/tdm/userlicense/1.0/

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