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      High-resolution Z-contrast imaging of crystals

      Author(s): ,
      Publication date Created:
      Publication date (Print):
      Journal: Ultramicroscopy
      Publisher: Elsevier BV

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          Relativistic Hartree–Fock X-ray and electron scattering factors

          P. Doyle, P. S. Turner (1968)
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            Stabilities of single-layer and bilayer steps on Si(001) surfaces

            D Chadi (1987)
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              The Theoretical Resolution Limit of the Electron Microscope

              O. Scherzer (1949)
              Article 0 comments Cited 120 times – based on 0 reviews     Review now
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                Author and article information

                Journal
                Title: Ultramicroscopy
                Abbreviated Title: Ultramicroscopy
                Publisher: Elsevier BV
                ISSN (Print): 03043991
                Publication date Created: August 1991
                Publication date (Print): August 1991
                Volume: 37
                Issue: 1-4
                Pages: 14-38
                Article
                DOI: 10.1016/0304-3991(91)90004-P
                SO-VID: cf32b95d-3f6b-4a68-b0d6-5ae167c8c533
                Copyright © © 1991
                License:

                http://www.elsevier.com/tdm/userlicense/1.0/

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