56
views
0
recommends
+1 Recommend
1 collections
    1
    shares
      • Record: found
      • Abstract: found
      • Article: found
      Is Open Access

      Incipient low-temperature formation of MAX phase in Cr–Al–C films

      research-article

      Read this article at

      ScienceOpenPublisher
      Bookmark
          There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.

          Abstract

          Ceramic-metallic MAX phase of chromium aluminium carbide ternary compounds was successfully obtained through deposition by DC sputtering onto Si substrates. A study of the influence of substrate temperature and in-air post-annealing on the film crystallinity and oxidation was undertaken. Scanning electron microscopy (SEM), wavelength-dispersive X-ray analysis (WDSX), and X-ray diffraction (XRD) were used for film characterization. It is shown that, at substrate temperature of about 450 ℃, as-deposited films are amorphous with small nanocrystals. Subsequent annealing in air at 700 ℃ leads to film crystallization and partial oxidation. WDSX spectroscopy shows that the films oxidise to a depth of around 120 nm, or 5% of total film thickness which amounts at around 2.68 µm. As a novelty, this demonstrates the possibility of in-air crystallization of Cr 2AlC films without significant oxidation. Materials Analysis Using Diffraction (MAUD) software package for a full-profile analysis of the XRD patterns (Rietveld-type) was used to determine that, as a result of annealing, the average crystallite size changes from 7 to 34 nm, while microstrain decreases from 0.79% to 0.24%. A slight tendency of preferential growth along the ( 10 1 ¯ 0 ) direction has been observed. Such texturing of the microstructure has the potential of inducing beneficial anisotropic fracture behaviour in the coatings, potentially interesting for several industrial applications in load-bearing devices.

          Author and article information

          Journal
          Journal of Advanced Ceramics
          Journal of Advanced Ceramics
          Tsinghua University Press (Tsinghua University, Beijing 100084, China )
          2226-4108
          05 June 2018
          : 07
          : 02
          : 143-151 (pp. )
          Affiliations
          [1]National Institute for Materials Physics, PO Box MG-7, 077125 Bucharest, Magurele, Romania
          Author notes
          * Corresponding author. E-mail: ocrisan@ 123456infim.ro
          Article
          2226-4108-07-02-143
          10.1007/s40145-018-0265-5
          cf505582-c39e-4147-80c0-f10e69dd7ab4

          This work is licensed under a Creative Commons Attribution 4.0 Unported License. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/

          History
          : 21 November 2017
          : 22 February 2018
          : 03 March 2018
          Categories
          Research Article

          Materials technology,Materials properties,Materials characterization,Composites,Ceramics
          DC sputtering,ternary carbides,wavelength-dispersive X-ray analysis (WDSX),X-ray diffraction (XRD),annealing,crystallization

          Comments

          Comment on this article