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Untersuchung des elektrischen widerstandes und des weglängeneffektes der leitungselektronen an dünnen kupferdrähten
Author(s):
H.H. Mende
,
U. Neitz
Publication date
Created:
November 1973
Publication date
(Print):
November 1973
Journal:
Solid State Communications
Publisher:
Elsevier BV
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HTWK Leipzig / OA-HVerlag
Author and article information
Journal
Title:
Solid State Communications
Abbreviated Title:
Solid State Communications
Publisher:
Elsevier BV
ISSN (Print):
00381098
Publication date Created:
November 1973
Publication date (Print):
November 1973
Volume
: 13
Issue
: 10
Pages
: 1633-1635
Article
DOI:
10.1016/0038-1098(73)90254-8
SO-VID:
cf565e0d-583d-4fed-8c87-bd2046d51b09
Copyright ©
© 1973
License:
https://www.elsevier.com/tdm/userlicense/1.0/
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