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Resolving ruthenium: XPS studies of common ruthenium materials : XPS studies of common ruthenium materials
Author(s):
David J. Morgan
Publication date
Created:
November 2015
Publication date
(Print):
November 2015
Journal:
Surface and Interface Analysis
Publisher:
Wiley-Blackwell
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Empirical atomic sensitivity factors for quantitative analysis by electron spectroscopy for chemical analysis
M. V. Zeller
,
J A Taylor
,
R. Raymond
…
(1981)
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Surface chemistry of ruthenium dioxide in heterogeneous catalysis and electrocatalysis: from fundamental to applied research.
Herbert Over
(2012)
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Characterization of the PEDOT-PSS system by means of X-ray and ultraviolet photoelectron spectroscopy
G Greczynski
,
Th Kugler
,
W.R Salaneck
(1999)
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Journal
Title:
Surface and Interface Analysis
Abbreviated Title:
Surf. Interface Anal.
Publisher:
Wiley-Blackwell
ISSN:
01422421
Publication date Created:
November 2015
Publication date (Print):
November 2015
Volume
: 47
Issue
: 11
Pages
: 1072-1079
Article
DOI:
10.1002/sia.5852
SO-VID:
cfab36c8-0f10-4d3d-86b5-172e3f9b7831
Copyright ©
© 2015
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http://doi.wiley.com/10.1002/tdm_license_1.1
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