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      Tunnel-injected sub 290 nm ultra-violet light emitting diodes with 2.8% external quantum efficiency

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          Ultraviolet light-emitting diodes based on group three nitrides

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            222-282 nm AlGaN and InAlGaN-based deep-UV LEDs fabricated on high-quality AlN on sapphire

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              Deep-ultraviolet light-emitting diodes with external quantum efficiency higher than 20% at 275 nm achieved by improving light-extraction efficiency

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                Author and article information

                Journal
                Applied Physics Letters
                Appl. Phys. Lett.
                AIP Publishing
                0003-6951
                1077-3118
                February 12 2018
                February 12 2018
                : 112
                : 7
                : 071107
                Affiliations
                [1 ]Department of Electrical and Computer Engineering, The Ohio State University, Columbus, Ohio 43210, USA
                [2 ]Department of Materials Science and Engineering, The Ohio State University, Columbus, Ohio 43210, USA
                [3 ]Sandia National Laboratories, Albuquerque, New Mexico 87185, USA
                Article
                10.1063/1.5017045
                d02f7cf8-6593-4b9d-b082-600d74cece44
                © 2018

                https://publishing.aip.org/authors/rights-and-permissions

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