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      • Record: found
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      Contact electrification using force microscopy

      Author(s): , , ,
      Publication date (Electronic):
      Journal: Physical Review Letters
      Publisher: American Physical Society (APS)

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          Atomic Force Microscope

          G. Binnig, C Quate, Andreas Gerber (1987)
          Article 0 comments Cited 2124 times – based on 0 reviews     Review now
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            Atomic force microscope–force mapping and profiling on a sub 100‐Å scale

            Y Martin, C Williams, H. Wickramasinghe (1987)
            Article 0 comments Cited 322 times – based on 0 reviews     Review now
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              Contact electrification

              J. Lowell, A.C. Rose-Innes (2006)
              Article 0 comments Cited 181 times – based on 0 reviews     Review now
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                Author and article information

                Journal
                Journal ID (publisher-id): PRLTAO
                Title: Physical Review Letters
                Abbreviated Title: Phys. Rev. Lett.
                Publisher: American Physical Society (APS)
                ISSN (Print): 0031-9007
                Publication date Created: December 1989
                Publication date (Electronic): December 11 1989
                Volume: 63
                Issue: 24
                Pages: 2669-2672
                Article
                DOI: 10.1103/PhysRevLett.63.2669
                PubMed ID: 10040956
                SO-VID: d121e309-27e8-448b-bb01-78e510ee4b64
                Copyright © © 1989
                License:

                http://link.aps.org/licenses/aps-default-license

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