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      Attonewton force detection using ultrathin silicon cantilevers

      Author(s): , , , , ,
      Publication date Created:
      Publication date (Print):
      Journal: Applied Physics Letters
      Publisher: AIP Publishing

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          Atomic Force Microscope

          G. Binnig, C Quate, Andreas Gerber (1987)
          Article 0 comments Cited 2204 times – based on 0 reviews     Review now
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            Improved fiber‐optic interferometer for atomic force microscopy

            D Rugar, P. Guethner, H J Mamin (1989)
            Article 0 comments Cited 194 times – based on 0 reviews     Review now
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              Magnetic resonance force microscopy

              J Sidles, J Garbini, K. Bruland … (1995)
              Article 0 comments Cited 170 times – based on 0 reviews     Review now
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                Author and article information

                Journal
                Title: Applied Physics Letters
                Abbreviated Title: Appl. Phys. Lett.
                Publisher: AIP Publishing
                ISSN (Print): 0003-6951
                ISSN (Electronic): 1077-3118
                Publication date Created: July 14 1997
                Publication date (Print): July 14 1997
                Volume: 71
                Issue: 2
                Pages: 288-290
                Article
                DOI: 10.1063/1.119522
                SO-VID: d3270497-add6-4753-90b6-1b047ec7e42a
                Copyright © © 1997
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