Electrical properties and recombination activity of copper, nickel and cobalt in silicon

Weber, E.R.; Istratov, A.A.

doi:10.1007/s003390050649

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Electrical properties and recombination activity of copper, nickel and cobalt in silicon

Author(s): A.A. Istratov , E.R. Weber

Publication date Created: February 1 1998

Publication date (Print): February 1 1998

Journal: Applied Physics A: Materials Science & Processing

Publisher: Springer Nature

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Journal ID (publisher-id): 339

Title: Applied Physics A: Materials Science & Processing

Abbreviated Title: Applied Physics A: Materials Science & Processing

Publisher: Springer Nature

ISSN (Print): 0947-8396

ISSN (Electronic): 1432-0630

Publication date Created: February 1 1998

Publication date (Print): February 1 1998

Volume: 66

Issue: 2

Pages: 123-136

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DOI: 10.1007/s003390050649

SO-VID: d32d71f1-b5c7-4a44-b490-72d18e43509a

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