- Record: found
- Abstract: not found
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Nondestructive analysis of threading dislocations in GaN by electron channeling contrast imaging
Y. N. Picard ,
J. D. Caldwell ,
M. E. Twigg ,
C. R. Eddy ,
M. A. Mastro ,
R. L. Henry ,
R. T. Holm ,
P. G. Neudeck ,
A. J. Trunek ,
J. A. Powell
August 27 2007
August 27 2007
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Most cited references19
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Correlation of cathodoluminescence inhomogeneity with microstructural defects in epitaxial GaN grown by metalorganic chemical-vapor deposition
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Characterization of threading dislocations in GaN epitaxial layers
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The role of threading dislocations in the physical properties of GaN and its alloys
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