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Correlation of thermal‐wave imaging to other analysis methods
Author(s):
Jiří Marek
,
Yale E. Strausser
Publication date
Created:
June 15 1984
Publication date
(Print):
June 15 1984
Journal:
Applied Physics Letters
Publisher:
AIP Publishing
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Thermal Imaging in Social Decision Making
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6
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Intrinsic Optical Absorption in Single-Crystal Germanium and Silicon at 77°K and 300°K
W. Dash
,
R. Newman
(1955)
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Determination of Kilovolt Electron Energy Dissipation vs Penetration Distance in Solid Materials
P. Hoff
,
T E Everhart
(1971)
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Temperature dependence of the optical properties of silicon
D Redfield
,
H. Weakliem
(1979)
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Author and article information
Journal
Title:
Applied Physics Letters
Abbreviated Title:
Appl. Phys. Lett.
Publisher:
AIP Publishing
ISSN (Print):
0003-6951
ISSN (Electronic):
1077-3118
Publication date Created:
June 15 1984
Publication date (Print):
June 15 1984
Volume
: 44
Issue
: 12
Pages
: 1152-1154
Article
DOI:
10.1063/1.94674
SO-VID:
d4e15682-893f-49da-8a43-72d20b875a90
Copyright ©
© 1984
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