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Analysis of the charge pumping technique and its application for the evaluation of MOSFET degradation
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Most cited references29
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A reliable approach to charge-pumping measurements in MOS transistors
H.E. Maes, G. Groeseneken, N. Beltran … (1984)
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Charge pumping in MOS devices
J.S. Brugler, P.G.A. Jespers (1969)
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Consistent model for the hot-carrier degradation in n-channel and p-channel MOSFETs
G. Groeseneken, P. Heremans, R. Bellens … (1988)