ScienceOpen:
research and publishing network
For Publishers
Discovery
Metadata
Peer review
Hosting
Publishing
For Researchers
Join
Publish
Review
Collect
My ScienceOpen
Sign in
Register
Dashboard
Blog
About
Search
Advanced search
My ScienceOpen
Sign in
Register
Dashboard
Search
Search
Advanced search
For Publishers
Discovery
Metadata
Peer review
Hosting
Publishing
For Researchers
Join
Publish
Review
Collect
Blog
About
6
views
0
references
Top references
cited by
4
0 reviews
Review
0
comments
Comment
0
recommends
+1
Recommend
0
collections
Add to
0
shares
Share
Twitter
Sina Weibo
Facebook
Email
1,652
similar
All similar
Record
: found
Abstract
: not found
Article
: not found
The ROCS Workshop and 25years of compound semiconductor reliability
Author(s):
William J. Roesch
Publication date:
2011
Journal:
Microelectronics Reliability
Read this article at
ScienceOpen
Publisher
Bookmark
There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.
Related collections
Electronic Workshops in Computing (eWiC)
Author and article information
Journal
DOI::
10.1016/j.microrel.2010.09.005
Data availability:
Comments
Comment on this article
Sign in to comment
scite_
Similar content
1,652
Insights of the genetic diversity of DENV-1 detected in Brazil in 25years: Analysis of the envelope domain III allows lineages characterization
Authors:
Fernanda de Bruycker-Nogueira
,
Rita Maria Ribeiro Nogueira
,
Nieli Rodrigues da Costa Faria
…
68. Exposure to maternal prenatal depression predicts offspring inflammation at 25years
Authors:
D.T. Plant
,
S Pawlby
,
C.M. Pariante
Invasive recurrence of serous borderline ovarian tumor as multifocal lymphadenopathy 25years after initial diagnosis
Authors:
Ioannis Alagkiozidis
,
Sandy Dorcelus
,
Jonathan Somma
…
See all similar
Cited by
4
The Design and Thermal Reliability Analysis of a High-Efficiency K-Band MMIC Medium-Power Amplifier with Multiharmonic Matching
Authors:
X. Xu
,
Y. Shang
,
H. Xu
…
Reliability Studies in the Real World
Authors:
William J. Roesch
The Design and Life Test of a Multifunction Power Amplifier for Space Application
Authors:
Zhengliang Huang
,
Faxin Yu
,
Xiuqin Xu
…
See all cited by