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      Phase formation and texture of nickel silicides on Si1−xCx epilayers

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          Journal
          Microelectronic Engineering
          Microelectronic Engineering
          Elsevier BV
          01679317
          May 2011
          May 2011
          : 88
          : 5
          : 536-540
          Article
          10.1016/j.mee.2010.06.010
          d8d70429-3394-44ca-901d-e4cd962d912a
          © 2011

          https://www.elsevier.com/tdm/userlicense/1.0/

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