ScienceOpen:
research and publishing network
For Publishers
Discovery
Metadata
Peer review
Hosting
Publishing
For Researchers
Join
Publish
Review
Collect
My ScienceOpen
Sign in
Register
Dashboard
Blog
About
Search
Advanced search
My ScienceOpen
Sign in
Register
Dashboard
Search
Search
Advanced search
For Publishers
Discovery
Metadata
Peer review
Hosting
Publishing
For Researchers
Join
Publish
Review
Collect
Blog
About
2
views
0
references
Top references
cited by
2
0 reviews
Review
0
comments
Comment
0
recommends
+1
Recommend
0
collections
Add to
0
shares
Share
Twitter
Sina Weibo
Facebook
Email
1,474
similar
All similar
Record
: found
Abstract
: not found
Article
: not found
A re-examination of cobalt-related defects in n- and p-type silicon
Author(s):
Leopold Scheffler
,
Vladimir Kolkovsky
,
Jörg Weber
Publication date:
2012
Journal:
Phys. Status Solidi A
Read this article at
ScienceOpen
Publisher
Bookmark
There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.
Related collections
ChemSpider related publications
Author and article information
Journal
DOI::
10.1002/pssa.201200140
Data availability:
Comments
Comment on this article
Sign in to comment
scite_
Similar content
1,474
Relationship between Vitamin B12 and Cobalt Metabolism in Domestic Ruminant: An Update
Authors:
Jose-Ramiro González-Montaña
,
Francisco Escalera-Valente
,
Angel J. Alonso
…
Sol–gel derived nanostructure undoped and cobalt doped ZnO: Structural, optical and electrical studies
Authors:
Y. Caglar
,
Yasemin Caglar
Getting harder: cobalt(III)-template synthesis of catenanes and rotaxanes.
Authors:
David Leigh
,
Paul J Lusby
,
Roy T. McBurney
…
See all similar
Cited by
2
Cobalt-related defects in silicon
Authors:
T. Gibbons
,
D. J. Backlund
,
S K Estreicher
Electrical levels in nickel doped silicon
Authors:
Vl Kolkovsky
,
L. Scheffler
,
J. Weber
See all cited by