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      Optical and electrical properties of SnO2 thin films in relation to their stoichiometric deviation and their crystalline structure

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      Thin Solid Films

      Elsevier BV

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          Most cited references 7

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          A simple method for the determination of the optical constants n, k and the thickness of a weakly absorbing thin film

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            Highly Conductive, Transparent Films of Sputtered In[sub 2−x]Sn[sub x]O[sub 3−y]

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              Microanalysis by the direct observation of nuclear reactions using a 2 MeV Van de Graaff

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                Author and article information

                Journal
                Thin Solid Films
                Thin Solid Films
                Elsevier BV
                00406090
                March 1977
                March 1977
                : 41
                : 2
                : 127-135
                Article
                10.1016/0040-6090(77)90395-9
                © 1977

                http://www.elsevier.com/tdm/userlicense/1.0/

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