Optical and electrical properties of SnO2 thin films in relation to their stoichiometric deviation and their crystalline structure

Manifacier, J.C; Fillard, J.P; De Murcia, M.; Vicario, E.

doi:10.1016/0040-6090(77)90395-9

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Optical and electrical properties of SnO2 thin films in relation to their stoichiometric deviation and their crystalline structure

Author(s): J.C. Manifacier , M. De Murcia , J.P. Fillard , E. Vicario

Publication date Created: March 1977

Publication date (Print): March 1977

Journal: Thin Solid Films

Publisher: Elsevier BV

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Most cited references 7

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A simple method for the determination of the optical constants n, k and the thickness of a weakly absorbing thin film

J P Fillard, J C Manifacier, J Gasiot (1976)

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Highly Conductive, Transparent Films of Sputtered In[sub 2−x]Sn[sub x]O[sub 3−y]

D B Fraser, H. D. Cook (1972)

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Microanalysis by the direct observation of nuclear reactions using a 2 MeV Van de Graaff

D. David, G. Amsel, J. Moulin … (1971)

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Journal

Title: Thin Solid Films

Abbreviated Title: Thin Solid Films

Publisher: Elsevier BV

ISSN (Print): 00406090

Publication date Created: March 1977

Publication date (Print): March 1977

Volume: 41

Issue: 2

Pages: 127-135

Article

DOI: 10.1016/0040-6090(77)90395-9

SO-VID: dbba140b-336f-4434-af53-00b201f9bf62

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http://www.elsevier.com/tdm/userlicense/1.0/

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Optical and electrical properties of SnO2 thin films in relation to their stoichiometric deviation and their crystalline structure

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Most cited references 7

A simple method for the determination of the optical constants n, k and the thickness of a weakly absorbing thin film

Highly Conductive, Transparent Films of Sputtered In[sub 2−x]Sn[sub x]O[sub 3−y]

Microanalysis by the direct observation of nuclear reactions using a 2 MeV Van de Graaff

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