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      A Commercial Field-Programmable Dense eFUSE Array Memory with 99.999% Sense Yield for 45nm SOI CMOS

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      , , , , , , , , , ,
      IEEE
      2008 IEEE International Solid-State Circuits Conference
      March 3, 2008 - March 7, 2008

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          Conference
          IEEE
          February 2008
          February 2008
          : 406-407
          Article
          10.1109/ISSCC.2008.4523229
          dc22c9c2-49e5-4fc5-aebe-d1fce349b770
          © 2008
          2008 IEEE International Solid-State Circuits Conference
          San Francisco, CA, USA
          March 3, 2008 - March 7, 2008
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