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Small-angle subgrain boundaries emanating from dislocation pile-ups in multicrystalline silicon studied with synchrotron white-beam X-ray topography
Author(s):
D. Oriwol
,
E.-R. Carl
,
A.N. Danilewsky
,
L. Sylla
,
W. Seifert
,
M. Kittler
,
H.S. Leipner
Publication date
Created:
October 2013
Publication date
(Print):
October 2013
Journal:
Acta Materialia
Publisher:
Elsevier BV
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There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.
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SAXS
Author and article information
Journal
Title:
Acta Materialia
Abbreviated Title:
Acta Materialia
Publisher:
Elsevier BV
ISSN (Print):
13596454
Publication date Created:
October 2013
Publication date (Print):
October 2013
Volume
: 61
Issue
: 18
Pages
: 6903-6910
Article
DOI:
10.1016/j.actamat.2013.08.002
SO-VID:
dccbd514-ba32-49e0-8d1b-df8fe4059e83
Copyright ©
© 2013
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