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      Isochronal annealing of a deformed Fe-7.5 mass.% Si-steel

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          Abstract

          FeSi samples with 7.5 mass.% Si were cold deformed with a thickness reduction of 16% and isochronally annealed for one hour at different temperatures. Their microstructure was characterised using positron annihilation lifetime spectroscopy and electron backscatter diffraction.

          Positron annihilation mean lifetime values (τ mean) decreased slightly with the increase in annealing temperature (20 to 600°C), a process related to recovery. In addition, τ mean decreased significantly in the 700–900°C temperature range. The measured value of τ mean is 106 ps, which is similar to the pure undeformed Fe after annealing at 900°C. Thus, the material is virtually free of defects at 900°C. Microscopy and diffraction studies showed a high amount of shear bands for the deformed sample. In the temperature range of 20–600°C, no recrystallisation was observed. According to the electron backscatter diffraction data, the recrystallisation starts after 700°C, and it is completed at 900°C.

          Author and article information

          Journal
          ijmr
          International Journal of Materials Research
          Carl Hanser Verlag
          1862-5282
          2195-8556
          2012
          : 103
          : 12
          : 1440-1443
          Affiliations
          a Ghent University, Department of Materials Science and Engineering, Ghent, Belgium.
          b Ghent Universiy, Department of Physics and Astronomy, Ghent, Belgium
          c Delft University of Technology, Department of Materials Science and Engineering, Delft, The Netherlands
          d CTM-Technologic Centre, Area of Materials Forming Processes, Manresa, Barcelona, Spain
          e Universidad Politécnica de Cataluña, Department of Materials Science and Metallurgical Engineering, Barcelona, Spain
          Author notes
          [* ] Correspondence address, Lic. Fernando González Cámara, Ghent University, Technologiepark 903, B-9052 Zwijnaarde (Gent) – Belgium. Tel.: 0032 (0) 93310443, Fax: 0032 (0) 92645833, E-mail: fernando.gonzalezcamara@ 123456ugent.be
          Article
          MK110793
          10.3139/146.110793
          dcde8622-8606-43fb-a9ae-ed9597a4c5e1
          © 2012, Carl Hanser Verlag, München
          History
          : 28 November 2011
          : 26 April 2012
          : 30 May 2012
          Page count
          References: 28, Pages: 4
          Categories
          Original Contributions

          Materials technology,Materials characterization,Materials science
          High silicon steel,Electron backscatter diffraction,Recovery,Positron annihilation

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