Black silicon UV photodiodes achieve >130% external quantum efficiency

Abstract

At present ultraviolet sensors are utilized in numerous fields ranging from various spectroscopy applications via biotechnical innovations to industrial process control. Despite of this, the performance of current UV sensors is surprisingly poor. Here, we break the theoretical Shockley Queisser lim it and demonstrate a device with a certified external quantum efficiency (EQE) above 130% in UV range without external amplification. The record high performance is obtained using a nanostructured silicon photodiode with self induced junction. We show that the high efficiency is based on effective utilization of multiple carrier generation by impact ionization taking place in the nanostructures. While the results can readily have a significant impact on the UV sensor industry, the underlying technological c oncept can be applied to other semiconductor materials, thereby extending above unity response to longer wavelengths.