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      Fatigue and switching in ferroelectric memories: Theory and experiment

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      Journal of Applied Physics
      AIP Publishing

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          Switching kinetics of lead zirconate titanate submicron thin‐film memories

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            Theoretical Considerations on the Switching Transient in Ferroelectrics

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              Radiation effects on ferroelectric thin‐film memories: Retention failure mechanisms

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                Author and article information

                Journal
                Journal of Applied Physics
                Journal of Applied Physics
                AIP Publishing
                0021-8979
                1089-7550
                December 1990
                December 1990
                : 68
                : 11
                : 5783-5791
                Article
                10.1063/1.346948
                ddc76850-f3bd-4865-9375-78c1ac78d32f
                © 1990
                History

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