Rietveld refinement of Debye–Scherrer synchrotron X-ray data from Al2O3

Thompson, Van P.; Cox, D. E.; Hastings, J B

doi:10.1107/S0021889887087090

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Rietveld refinement of Debye–Scherrer synchrotron X-ray data from Al2O3

Author(s): P. Thompson , D. E. Cox , J. B. Hastings

Publication date Created: April 1987

Publication date (Print): April 1987

Journal: Journal of Applied Crystallography

Publisher: International Union of Crystallography (IUCr)

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Journal ID (publisher-id): JACGAR

Title: Journal of Applied Crystallography

Abbreviated Title: J Appl Crystallogr

Publisher: International Union of Crystallography (IUCr)

ISSN (Print): 0021-8898

Publication date Created: April 1987

Publication date (Print): April 1987

Volume: 20

Issue: 2

Pages: 79-83

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DOI: 10.1107/S0021889887087090

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Self URI (article page): http://scripts.iucr.org/cgi-bin/paper?S0021889887087090

Rietveld refinement of Debye–Scherrer synchrotron X-ray data from Al2O3

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