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      Guided Electromagnetic Wave Technique for IC Authentication

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          Abstract

          Counterfeiting of an Integrated Circuit (IC) has become a significant concern for electronics manufacturers, system integrators, and end users. It is necessary to find a robust implementation that is efficient, low cost, and noninvasive in detection and avoidance of ICs counterfeiting. In this paper, we introduce the concept of using a guided radiofrequency (RF) wave technique to authenticate ICs. The approach discussed in this work highlights the use of electromagnetic (EM)/radiofrequency (RF) response that has been further evaluated to assign fingerprint or signature of ICs for the purpose of authentication. Our approach is to use EM/RF guided wave to sense the response of the ICs, extract the manufacturing-based process variation of an IC and finally generate identifier or signature of that IC. As a proof-of-concept, we performed experiments over different field-programmable gate array (FPGA) boards of the same family. The post-processing technique was applied on the measurement results to statistically quantify the error probability of the authentication technique.

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          Most cited references24

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          Physical Unclonable Functions and Applications: A Tutorial

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            Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain

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              PUFKY: A Fully Functional PUF-Based Cryptographic Key Generator

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                Author and article information

                Journal
                Sensors (Basel)
                Sensors (Basel)
                sensors
                Sensors (Basel, Switzerland)
                MDPI
                1424-8220
                05 April 2020
                April 2020
                : 20
                : 7
                : 2041
                Affiliations
                [1 ]ORSYS & CTSYS, LCIS, University of Grenoble Alpes, 26000 Valence, France; Etienne.Perret@ 123456lcis.grenoble-inp.fr (E.P.); david.hely@ 123456lcis.grenoble-inp.fr (D.H.); romain.siragusa@ 123456lcis.grenoble-inp.fr (R.S.); nicolas.barbot@ 123456lcis.grenoble-inp.fr (N.B.)
                [2 ]Institut Universitaire de France, 75231 Paris, France
                Author notes
                Author information
                https://orcid.org/0000-0002-2671-8366
                https://orcid.org/0000-0003-3249-7667
                https://orcid.org/0000-0001-6725-4273
                https://orcid.org/0000-0001-6355-9109
                Article
                sensors-20-02041
                10.3390/s20072041
                7180788
                32260505
                e1d170c0-35ce-417e-b3c5-51f08363cc68
                © 2020 by the authors.

                Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license ( http://creativecommons.org/licenses/by/4.0/).

                History
                : 19 February 2020
                : 01 April 2020
                Categories
                Article

                Biomedical engineering
                counterfeit ic,em,fpga,process variation
                Biomedical engineering
                counterfeit ic, em, fpga, process variation

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