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      Baseline Estimation Using DEM Prior Knowledge and Capability Analysis for Gaofen-3 Repeat-Pass SAR Interferometry

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          Journal
          Title: IEEE Access
          Abbreviated Title: IEEE Access
          Publisher: Institute of Electrical and Electronics Engineers (IEEE)
          ISSN (Electronic): 2169-3536
          Publication date Created: 2019
          Publication date (Print): 2019
          Volume: 7
          Pages: 53225-53235
          Article
          DOI: 10.1109/ACCESS.2019.2912880
          SO-VID: e293dca6-a55b-4a63-a9ed-e0ccf9fd518e
          Copyright © © 2019
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