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      H/sup +/ irradiation for reverse recovery softness and reliability of power p-i-n diodes for snubberless applications

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      23rd International Conference on Microelectronics (MIEL 2002) (ICMEL-02)
      12-15 May 2002

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          Conference
          : 143-146
          Article
          10.1109/MIEL.2002.1003160
          e3eb69da-c19f-41a2-9fab-8a763ced03ac
          23rd International Conference on Microelectronics (MIEL 2002)
          ICMEL-02
          Nis, Yugoslavia
          12-15 May 2002
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