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      Monocular depth estimation based on deep learning: An overview

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          Deep Residual Learning for Image Recognition

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            Image Quality Assessment: From Error Visibility to Structural Similarity

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              Going deeper with convolutions

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                Author and article information

                Journal
                Science China Technological Sciences
                Sci. China Technol. Sci.
                Springer Science and Business Media LLC
                1674-7321
                1869-1900
                September 2020
                June 10 2020
                September 2020
                : 63
                : 9
                : 1612-1627
                Article
                10.1007/s11431-020-1582-8
                e5bdd6ae-180c-4555-a99e-8f5668dbda51
                © 2020

                https://www.springer.com/tdm

                https://www.springer.com/tdm

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