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      Resolution and contrast in Kelvin probe force microscopy

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      Journal of Applied Physics
      AIP Publishing

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          Kelvin probe force microscopy

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            High‐resolution capacitance measurement and potentiometry by force microscopy

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              High resolution atomic force microscopy potentiometry

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                Author and article information

                Journal
                Journal of Applied Physics
                Journal of Applied Physics
                AIP Publishing
                0021-8979
                1089-7550
                August 1998
                August 1998
                : 84
                : 3
                : 1168-1173
                Article
                10.1063/1.368181
                e61aea9f-f4e1-4f0f-938a-018396938659
                © 1998
                Product
                Self URI (article page): http://aip.scitation.org/doi/10.1063/1.368181

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