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      Resolution and contrast in Kelvin probe force microscopy

      Author(s): , , ,
      Publication date Created:
      Publication date (Print):
      Journal: Journal of Applied Physics
      Publisher: AIP Publishing

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          Kelvin probe force microscopy

          H. Wickramasinghe, M Nonnenmacher, M. P. O’Boyle (1991)
          Article 0 comments Cited 420 times – based on 0 reviews     Review now
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            High‐resolution capacitance measurement and potentiometry by force microscopy

            Yves Martin, H Kumar Wickramasinghe, David W. Abraham (1988)
            Article 0 comments Cited 161 times – based on 0 reviews     Review now
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              High resolution atomic force microscopy potentiometry

              J. M. R. Weaver (1991)
              Article 0 comments Cited 90 times – based on 0 reviews     Review now
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                Author and article information

                Journal
                Title: Journal of Applied Physics
                Abbreviated Title: Journal of Applied Physics
                Publisher: AIP Publishing
                ISSN (Print): 0021-8979
                ISSN (Electronic): 1089-7550
                Publication date Created: August 1998
                Publication date (Print): August 1998
                Volume: 84
                Issue: 3
                Pages: 1168-1173
                Article
                DOI: 10.1063/1.368181
                SO-VID: e61aea9f-f4e1-4f0f-938a-018396938659
                Copyright statement: © 1998
                Product
                Self URI (article page): http://aip.scitation.org/doi/10.1063/1.368181

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