Electron Microholography by Two-Beam Method

Tomita, Hiroshi; Matsuda, Tsuyoshi; Komoda, Tsutomu

doi:10.1143/JJAP.9.719

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Electron Microholography by Two-Beam Method

Author(s): Hiroshi Tomita , Tsuyoshi Matsuda , Tsutomu Komoda

Publication date Created: June 1970

Publication date (Print): June 1970

Journal: Japanese Journal of Applied Physics

Publisher: Japan Society of Applied Physics

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Journal ID (publisher-id): JAPNDE

Title: Japanese Journal of Applied Physics

Abbreviated Title: Jpn. J. Appl. Phys.

Publisher: Japan Society of Applied Physics

ISSN (Print): 0021-4922

ISSN (Electronic): 1347-4065

Publication date Created: June 1970

Publication date (Print): June 1970

Volume: 9

Issue: 6

Page: 719

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DOI: 10.1143/JJAP.9.719

SO-VID: e715b6b6-161c-4a99-bff4-f8cb669b338c

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Electron Microholography by Two-Beam Method

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Electron Channelling Contrast Imaging (ECCI)

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