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      Characterization of layered synthetic microstructure by transmission electron microscopy and diffraction

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      Optics Letters
      The Optical Society

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          Journal
          OPLEDP
          Optics Letters
          Opt. Lett.
          The Optical Society
          0146-9592
          1539-4794
          1984
          1984
          October 01 1984
          October 01 1984
          : 9
          : 10
          : 433
          Article
          10.1364/OL.9.000433
          e809605d-616d-474b-9673-a44fea614de4
          © 1984
          History

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