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      Composition determination in the GaAs/(Al, Ga)As system using contrast in dark-field transmission electron microscope images

      Author(s): ,
      Publication date Created:
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      Journal: Philosophical Magazine A
      Publisher: Informa UK Limited

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          Relativistic Hartree–Fock X-ray and electron scattering factors

          P. Doyle, P. S. Turner (1968)
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            Transmission electron microscopy of interfaces in III–V compound semiconductors

            P. Petroff (1977)
            Article 0 comments Cited 59 times – based on 0 reviews     Review now
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              On elastic relaxation and long wavelength microstructures in spinodally decomposed InxGa1−x.AsyP1−yepitaxial layers

              A. Howie, J M Gibson, M Treacy (2006)
              Article 0 comments Cited 39 times – based on 0 reviews     Review now
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                Author and article information

                Journal
                Title: Philosophical Magazine A
                Abbreviated Title: Philosophical Magazine A
                Publisher: Informa UK Limited
                ISSN (Print): 0141-8610
                ISSN (Electronic): 1460-6992
                Publication date Created: August 20 2006
                Publication date (Print): August 20 2006
                Volume: 60
                Issue: 1
                Pages: 39-62
                Article
                DOI: 10.1080/01418618908221178
                SO-VID: e8968c73-5a62-460d-a1db-c95cf3b5e099
                Copyright © © 2006
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