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Microscale laser shock peening of thin films, part 2: high spatial resolution material characterization
Author(s):
Wenwu Zhang
,
Y. Yao
,
I. Noyan
,
W Zhang
,
Y.L. Yao
,
I.C Noyan
Publication date:
2004
Journal:
J. Manuf. Sci. Eng.
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HR-EBSD (High Resolution - Electron Back Scatter Diffraction)
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DOI::
10.1115/1.1645879
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