Small-angle X-ray scattering of extended defects in diamonds

Shiryaev, A.; Dembo, K.; Klyuev, Yu.; Naletov, A.; Feigelson, B.

doi:10.1107/S0021889803000530

Record: found
Abstract: not found
Article: not found

Small-angle X-ray scattering of extended defects in diamonds

Author(s): A. Shiryaev , K. Dembo , Yu. Klyuev , A. Naletov , B. Feigelson

Publication date (Print): April 2003

Journal: Journal of Applied Crystallography

Publisher: International Union of Crystallography (IUCr)

Read this article at

ScienceOpenPublisher

There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.

Abstract

Related collections

Author and article information

Journal

Journal ID (publisher-id): JACGAR

Title: Journal of Applied Crystallography

Abbreviated Title: J Appl Crystallogr

Publisher: International Union of Crystallography (IUCr)

ISSN (Print): 0021-8898

Publication date Created: June 2003

Publication date (Print): April 2003

Volume: 36

Issue: 3

Pages: 420-424

Article

DOI: 10.1107/S0021889803000530

SO-VID: eef35281-ab84-49aa-ba84-aa71f9329549

History

Data availability:

Comments

Comment on this article

Cited by 2

See all cited by

- Version 1

Small-angle X-ray scattering of extended defects in diamonds

Read this article at

Abstract

Related collections

SAXS

Author and article information

Journal

Article

History

Comments

Comment on this article

Similar content 924

Cited by 2