Small-angle X-ray scattering of extended defects in diamonds

Shiryaev, A.; Dembo, K.; Klyuev, Yu.; Naletov, A.; Feigelson, B.

doi:10.1107/S0021889803000530

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Small-angle X-ray scattering of extended defects in diamonds

Author(s): A. Shiryaev , K. Dembo , Yu. Klyuev , A. Naletov , B. Feigelson

Publication date (Print): April 2003

Journal: Journal of Applied Crystallography

Publisher: International Union of Crystallography (IUCr)

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Journal ID (publisher-id): JACGAR

Title: Journal of Applied Crystallography

Abbreviated Title: J Appl Crystallogr

Publisher: International Union of Crystallography (IUCr)

ISSN (Print): 0021-8898

Publication date Created: June 2003

Publication date (Print): April 2003

Volume: 36

Issue: 3

Pages: 420-424

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DOI: 10.1107/S0021889803000530

SO-VID: eef35281-ab84-49aa-ba84-aa71f9329549

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Self URI (article page): http://scripts.iucr.org/cgi-bin/paper?S0021889803000530

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Small-angle X-ray scattering of extended defects in diamonds

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