On the origin of threading dislocations in GaN films

Humphreys, C. J.; Barnard, J S; Rao, D. V. S.; Ghedia, C. S.; Moram, M. A.; Zhang, Y.; Kappers, M. J.

doi:10.1063/1.3225920

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On the origin of threading dislocations in GaN films

Author(s): M. A. Moram , C. S. Ghedia , D. V. S. Rao , J. S. Barnard , Y. Zhang , M. J. Kappers , C. J. Humphreys

Publication date Created: October 2009

Publication date (Print): October 2009

Journal: Journal of Applied Physics

Publisher: AIP Publishing

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WSXM: a software for scanning probe microscopy and a tool for nanotechnology.

I Horcas, R FERNÁNDEZ, J. M. Gómez-Rodríguez … (2007)

In this work we briefly describe the most relevant features of WSXM, a freeware scanning probe microscopy software based on MS-Windows. The article is structured in three different sections: The introduction is a perspective on the importance of software on scanning probe microscopy. The second section is devoted to describe the general structure of the application; in this section the capabilities of WSXM to read third party files are stressed. Finally, a detailed discussion of some relevant procedures of the software is carried out.