For Publishers
DiscoveryMetadataPeer reviewHostingPublishing
For Researchers
JoinPublishReviewCollect
Register
Blog
About
Search
Advanced search
My ScienceOpen
Search
For Publishers
For Researchers
Blog
About
12
views
11
references
 Top references
cited by
4
    
0 reviews
 Review
0
comments
 Comment
0
recommends
+1 Recommend
0 collections
    0
    shares
      1,574
      similar
       All similar
      • Record: found
      • Abstract: not found
      • Article: not found

      Measurements of the rectifying barrier heights of various rhodium silicides withn‐silicon

      Author(s): , , , ,
      Publication date Created:
      Publication date (Print):
      Journal: Applied Physics Letters
      Publisher: AIP Publishing

      Read this article at

      ScienceOpenPublisher
      Bookmark
          There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.

          Related collections

          Most cited references11

          • Record: found
          • Abstract: not found
          • Article: not found

          Metal—Semiconductor Barrier Height Measurement by the Differential Capacitance Method—One Carrier System

          Alvin M. Goodman (1963)
          Article 0 comments Cited 119 times – based on 0 reviews     Review now
            Bookmark
            • Record: found
            • Abstract: not found
            • Article: not found

            A modified forward I‐V plot for Schottky diodes with high series resistance

            H. Norde (1979)
            Article 0 comments Cited 101 times – based on 0 reviews     Review now
              Bookmark
              • Record: found
              • Abstract: not found
              • Article: not found

              Reverse current-voltage characteristics of metal-silicide Schottky diodes

              J.M. Andrews, M.P. Lepselter (1970)
              Article 0 comments Cited 61 times – based on 0 reviews     Review now
                Bookmark
                All references

                Author and article information

                Journal
                Title: Applied Physics Letters
                Abbreviated Title: Appl. Phys. Lett.
                Publisher: AIP Publishing
                ISSN (Print): 0003-6951
                ISSN (Electronic): 1077-3118
                Publication date Created: January 15 1980
                Publication date (Print): January 15 1980
                Volume: 36
                Issue: 2
                Pages: 153-155
                Article
                DOI: 10.1063/1.91412
                SO-VID: f72bdc4d-6b96-4723-819c-bc55ed99866b
                Copyright © © 1980
                History

                Data availability:

                Comments

                Comment on this article

                scite_

                Similar content1,574

                See all similar

                Cited by4

                See all cited by

                Most referenced authors57

                See all reference authors