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      Absolute Configuration Determination of Chiral API Molecules by MicroED Analysis of Cocrystal Powders Formed Based on Cocrystal Propensity Prediction Calculations**

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          Abstract

          Establishing the absolute configuration of chiral active pharmaceutical ingredients (APIs) is of great importance. Single crystal X‐ray diffraction (scXRD) has traditionally been the method of choice for such analysis, but scXRD requires the growth of large crystals, which can be challenging. Here, we present a method for determining absolute configuration that does not rely on the growth of large crystals. By examining microcrystals formed with chiral probes (small chiral compounds such as amino acids), absolute configuration can be unambiguously determined by microcrystal electron diffraction (MicroED). Our streamlined method employs three steps: (1) virtual screening to identify promising chiral probes, (2) experimental cocrystal screening and (3) structure determination by MicroED and absolute configuration assignment. We successfully applied this method to analyze two chiral API molecules currently on the market for which scXRD was not used to determine absolute configuration.

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          High-resolution structure determination by continuous rotation data collection in MicroED

          MicroED uses very small three-dimensional protein crystals and electron diffraction for structure determination. An improved data collection protocol for MicroED called “continuous rotation” is presented. Here microcrystals are continuously rotated during data collection yielding improved data, and allowing data processing with MOSFLM resulting in improved resolution for the model protein lysozyme. These improvements pave the way for the implementation and application of MicroED with wide applicability in structural biology.
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            The use of X-ray crystallography to determine absolute configuration.

            Essential background on the determination of absolute configuration by way of single-crystal X-ray diffraction (XRD) is presented. The use and limitations of an internal chiral reference are described. The physical model underlying the Flack parameter is explained. Absolute structure and absolute configuration are defined and their similarities and differences are highlighted. The necessary conditions on the Flack parameter for satisfactory absolute-structure determination are detailed. The symmetry and purity conditions for absolute-configuration determination are discussed. The physical basis of resonant scattering is briefly presented and the insights obtained from a complete derivation of a Bijvoet intensity ratio by way of the mean-square Friedel difference are exposed. The requirements on least-squares refinement are emphasized. The topics of right-handed axes, XRD intensity measurement, software, crystal-structure evaluation, errors in crystal structures, and compatibility of data in their relation to absolute-configuration determination are described. Characterization of the compounds and crystals by the physicochemical measurement of optical rotation, CD spectra, and enantioselective chromatography are presented. Some simple and some complex examples of absolute-configuration determination using combined XRD and CD measurements, using XRD and enantioselective chromatography, and in multiply-twinned crystals clarify the technique. The review concludes with comments on absolute-configuration determination from light-atom structures. Copyright 2007 Wiley-Liss, Inc.
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              The Assignment of Absolute Configuration by NMR†

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                Author and article information

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                Journal
                Chemistry – A European Journal
                Chemistry A European J
                Wiley
                0947-6539
                1521-3765
                March 07 2023
                February 06 2023
                March 07 2023
                : 29
                : 14
                Affiliations
                [1 ] J-STAR Research Inc. 6 Cedar Brook Dr Cranbury NJ 08512 USA
                [2 ] XtalPi Inc. Shenzhen Jingtai Technology Co. Ltd International Biomedical Innovation Park II 3F No. 2 Hongliu Road, Futian District Shenzhen 518100 China
                [3 ] XtalPi Inc. 245 Main St, 11th Floor Cambridge MA 02142 USA
                [4 ] NanoImaging Services Inc. 4940 Carroll Canyon Road, Suite 115 San Diego CA 92121 USA
                Article
                10.1002/chem.202203970
                f8a53c6b-2ea2-4d9a-8c3e-e5ec7f3936a0
                © 2023

                http://creativecommons.org/licenses/by-nc/4.0/

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