Current-Voltage and Spectral Response Based Characterization of Thin Film Silicon Solar Cells – Investigation of Primary Error Sources

Abstract

24th European Photovoltaic Solar Energy Conference, 21-25 September 2009, Hamburg, Germany; 2784-2788

Abstract

This paper focuses on parasitic effects which might influence spectral response (SR) and current-voltage (IV) measurements and can lead to major differences in Jsc (up to 22%) determined from SR- and IV-measurements. We will discuss the impact of current collection, different substrate types and bias light intensity on the SR- and IVcharacteristics of single, tandem and triple solar cells (a-Si:H, a-SiGe:H, μc-Si:H, a-Si:H/μc-Si:H). Some of these effects can be reduced or eliminated – e.g. parasitic current collection can be minimized by electrically isolating the solar cell (laser isolation). To reduce the influence of the spectral mismatch of a sun simulator and the standard AM1.5g spectrum, a novel optical filter has been fabricated with which the optical mismatch according to the standard IEC 60904-9 [1] could be reduced to ±9%.