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      Structural and Electrical Characterization of ZnO Films Grown by Spray Pyrolysis and Their Application in Thin-Film Transistors

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          WSXM: a software for scanning probe microscopy and a tool for nanotechnology.

          In this work we briefly describe the most relevant features of WSXM, a freeware scanning probe microscopy software based on MS-Windows. The article is structured in three different sections: The introduction is a perspective on the importance of software on scanning probe microscopy. The second section is devoted to describe the general structure of the application; in this section the capabilities of WSXM to read third party files are stressed. Finally, a detailed discussion of some relevant procedures of the software is carried out.
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            Thin-film transistor fabricated in single-crystalline transparent oxide semiconductor.

            We report the fabrication of transparent field-effect transistors using a single-crystalline thin-film transparent oxide semiconductor, InGaO3(ZnO)5, as an electron channel and amorphous hafnium oxide as a gate insulator. The device exhibits an on-to-off current ratio of approximately 106 and a field-effect mobility of approximately 80 square centimeters per volt per second at room temperature, with operation insensitive to visible light irradiation. The result provides a step toward the realization of transparent electronics for next-generation optoelectronics.
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              ZnO-based transparent thin-film transistors

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                Author and article information

                Journal
                Advanced Functional Materials
                Adv. Funct. Mater.
                Wiley
                1616301X
                February 08 2011
                February 08 2011
                November 12 2010
                : 21
                : 3
                : 525-531
                Article
                10.1002/adfm.201001089
                © 2010

                http://doi.wiley.com/10.1002/tdm_license_1.1

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