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      Nonpolar and semipolar InGaN/GaN multiple-quantum-well solar cells with improved carrier collection efficiency

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          Origin of defect-insensitive emission probability in In-containing (Al,In,Ga)N alloy semiconductors.

          Group-III-nitride semiconductors have shown enormous potential as light sources for full-colour displays, optical storage and solid-state lighting. Remarkably, InGaN blue- and green-light-emitting diodes (LEDs) emit brilliant light although the threading dislocation density generated due to lattice mismatch is six orders of magnitude higher than that in conventional LEDs. Here we explain why In-containing (Al,In,Ga)N bulk films exhibit a defect-insensitive emission probability. From the extremely short positron diffusion lengths (<4 nm) and short radiative lifetimes of excitonic emissions, we conclude that localizing valence states associated with atomic condensates of In-N preferentially capture holes, which have a positive charge similar to positrons. The holes form localized excitons to emit the light, although some of the excitons recombine at non-radiative centres. The enterprising use of atomically inhomogeneous crystals is proposed for future innovation in light emitters even when using defective crystals.
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            Superior radiation resistance of In1−xGaxN alloys: Full-solar-spectrum photovoltaic material system

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              Design and characterization of GaN∕InGaN solar cells

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                Author and article information

                Journal
                Applied Physics Letters
                Appl. Phys. Lett.
                AIP Publishing
                0003-6951
                1077-3118
                April 17 2017
                April 17 2017
                : 110
                : 16
                : 161105
                Article
                10.1063/1.4980139
                f9d315e3-8226-49b5-869e-096cb7cf8829
                © 2017
                History

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