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      Space-charge electrets

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          Contact electrification using force microscopy.

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            Deposition and imaging of localized charge on insulator surfaces using a force microscope

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              Charge storage in a nitride‐oxide‐silicon medium by scanning capacitance microscopy

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                Author and article information

                Journal
                IEEE Transactions on Dielectrics and Electrical Insulation
                IEEE Trans. Dielect. Electr. Insul.
                Institute of Electrical and Electronics Engineers (IEEE)
                10709878
                Oct. 1996
                : 3
                : 5
                : 607-623
                Article
                10.1109/94.544184
                © 1996
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