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      Progressive steps in the development of electron backscatter diffraction and orientation imaging microscopy : EBSD AND OIM

      Journal of Microscopy

      Wiley-Blackwell

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          Orientation imaging: The emergence of a new microscopy

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            High-Angle Kikuchi Patterns

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              Backscatter Kikuchi diffraction in the SEM for identification of crystallographic point groups

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                Author and article information

                Journal
                Journal of Microscopy
                Wiley-Blackwell
                00222720
                13652818
                March 2004
                February 2004
                : 213
                : 3
                : 214-224
                Article
                10.1111/j.0022-2720.2004.01321.x
                © 2004

                http://doi.wiley.com/10.1002/tdm_license_1.1

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