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      A Prediction-Sampling-Based Multilayer-Structured Latent Factor Model for Accurate Representation to High-Dimensional and Sparse Data

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          Abstract

          <p class="first" id="d2751213e59">Performing highly accurate representation learning on a high-dimensional and sparse (HiDS) matrix is of great significance in a big data-related application such as a recommender system. A latent factor (LF) model is one of the most efficient approaches to the HiDS matrix representation. However, an LF model's representation learning ability relies heavily on an HiDS matrix's known data density, which is extremely low due to numerous missing data entities. To address this issue, this work proposes a prediction-sampling-based multilayer-structured LF (PMLF) model with twofold ideas: 1) constructing a loosely connected multilayered LF architecture to increase the known data density of an input HiDS matrix by generating synthetic data layer by layer and 2) constraining this synthetic data generating process through a random prediction-sampling strategy and nonlinear activations to avoid overfitting. In the experiments, PMLF is compared with six state-of-the-art LF-and deep neural network (DNN)-based models on four HiDS matrices from industrial applications. The results demonstrate that PMLF outperforms its peers in well-balancing prediction accuracy and computational efficiency. </p>

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          Author and article information

          Contributors
          Journal
          IEEE Transactions on Neural Networks and Learning Systems
          IEEE Trans. Neural Netw. Learning Syst.
          Institute of Electrical and Electronics Engineers (IEEE)
          2162-237X
          2162-2388
          2022
          : 1-14
          Affiliations
          [1 ]College of Computer and Information Science, Southwest University, Chongqing, China
          [2 ]Department of Computer Science, Old Dominion University, Norfolk, VA, USA
          [3 ]Department of Electrical and Computer Engineering, New Jersey Institute of Technology, Newark, NJ, USA
          Article
          10.1109/TNNLS.2022.3200009
          36083962
          fe309002-9394-4a09-9ffd-7fa727df4c12
          © 2022

          https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html

          https://doi.org/10.15223/policy-029

          https://doi.org/10.15223/policy-037

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