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      Biplate artifacts in rotating-compensator ellipsometers

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      Thin Solid Films
      Elsevier BV

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          Rotating-compensator multichannel ellipsometry: Applications for real time Stokes vector spectroscopy of thin film growth

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            <title>Recent developments in spectroscopic ellipsometry for in-situ applications</title>

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              Alignment and calibration of the MgF_2 biplate compensator for applications in rotating-compensator multichannel ellipsometry

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                Author and article information

                Journal
                Thin Solid Films
                Thin Solid Films
                Elsevier BV
                00406090
                May 2004
                May 2004
                : 455-456
                : 779-783
                Article
                10.1016/j.tsf.2004.01.033
                ffdf87fa-55dd-4989-b865-889f02eb4380
                © 2004

                https://www.elsevier.com/tdm/userlicense/1.0/

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