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      3D numerical modeling of the carrier transport and radiative efficiency for InGaN/GaN light emitting diodes with V-shaped pits

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          Most cited references33

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          High dislocation densities in high efficiency GaN‐based light‐emitting diodes

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            Strain-induced polarization in wurtzite III-nitride semipolar layers

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              Efficiency droop in nitride-based light-emitting diodes

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                Author and article information

                Journal
                AIP Advances
                AIP Advances
                AIP Publishing
                2158-3226
                May 2016
                May 2016
                : 6
                : 5
                : 055208
                Affiliations
                [1 ]Graduate Institute of Photonics and Optoelectronics and Department of Electrical Engineering, National Taiwan University, Taipei, 10617, Taiwan
                [2 ]Department of Photonics and Institute of Electro-Optical Engineering, National Chiao-Tung University, Hsinchu 30050, Taiwan
                Article
                10.1063/1.4950771
                04a29cd5-2f8f-453b-b179-b7310ff55b78
                © 2016

                http://creativecommons.org/licenses/by/4.0/

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