- Record: found
- Abstract: found
- Article: found
Microstructural analysis of a C/SiC ceramic based on the segmentation of X-ray phase contrast tomographic data
Oliver Wirjadi ,
Alexander Rack ,
André Liebscher ,
Jürgen Meinhardt ,
Katja Schladitz ,
Behrang Shafei ,
Gabriele Steidl
July 14 2014
July 14 2014
Read this article at
ScienceOpenPublisher
There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.
Abstract
Most cited references14
- Record: found
- Abstract: not found
- Article: not found
A new method for gray-level picture thresholding using the entropy of the histogram
J.N. Kapur, P.K. Sahoo, A.K.C. Wong (1985)
- Record: found
- Abstract: not found
- Article: not found
A new method for the model-independent assessment of thickness in three-dimensional images
T Hildebrand, P Rüegsegger (1997)
- Record: found
- Abstract: not found
- Conference Proceedings: not found
Ilastik: Interactive learning and segmentation toolkit
Christoph Sommer, Christoph Straehle, Ullrich Köthe … (2011)