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Small-angle X-ray scattering of extended defects in diamonds
Author(s):
A. Shiryaev
,
K. Dembo
,
Yu. Klyuev
,
A. Naletov
,
B. Feigelson
Publication date:
2003-06-01
Journal:
Journal of Applied Crystallography
Publisher:
International Union of Crystallography (IUCr)
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SAXS
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DOI::
10.1107/S0021889803000530
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