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      White-beam X-ray topography

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      Journal: Crystallography Reviews
      Publisher: Informa UK Limited

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          The projection topograph: a new method in X-ray diffraction microradiography

          A R Lang (1959)
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            �ber eine r�ntgenographische Methode zur Untersuchung von Gitterst�rungen an Kristallen

            Wolfgang Berg (1931)
            Article 0 comments Cited 28 times – based on 0 reviews     Review now
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              A method for the examination of crystal sections using penetrating characteristic X radiation

              A.R. Lang (1957)
              Article 0 comments Cited 23 times – based on 0 reviews     Review now
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                Author and article information

                Journal
                Title: Crystallography Reviews
                Abbreviated Title: Crystallography Reviews
                Publisher: Informa UK Limited
                ISSN (Print): 0889-311X
                ISSN (Electronic): 1476-3508
                Publication date Created: July 2012
                Publication date (Print): July 2012
                Volume: 18
                Issue: 3
                Pages: 207-235
                Article
                DOI: 10.1080/0889311X.2012.697462
                SO-VID: 00ce3a03-0b4b-43f3-a395-b74810bf1b52
                Copyright © © 2012
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