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      Enterprise Data Analysis and Visualization: An Interview Study

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          A Survey of Outlier Detection Methodologies

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            A survey of approaches to automatic schema matching

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              Duplicate Record Detection: A Survey

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                Author and article information

                Journal
                IEEE Transactions on Visualization and Computer Graphics
                IEEE Trans. Visual. Comput. Graphics
                Institute of Electrical and Electronics Engineers (IEEE)
                1077-2626
                December 2012
                December 2012
                : 18
                : 12
                : 2917-2926
                Article
                10.1109/TVCG.2012.219
                26357201
                01152014-ab15-45b5-a1e0-c7a13e668715
                © 2012
                History

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