49
views
0
recommends
+1 Recommend
0 collections
    4
    shares
      • Record: found
      • Abstract: found
      • Article: found
      Is Open Access

      Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip–surface interactions

      research-article

      Read this article at

      Bookmark
          There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.

          Summary

          We present a theoretical framework for the dynamic calibration of the higher eigenmode parameters (stiffness and optical lever inverse responsivity) of a cantilever. The method is based on the tip–surface force reconstruction technique and does not require any prior knowledge of the eigenmode shape or the particular form of the tip–surface interaction. The calibration method proposed requires a single-point force measurement by using a multimodal drive and its accuracy is independent of the unknown physical amplitude of a higher eigenmode.

          Abstract

          Related collections

          Most cited references33

          • Record: found
          • Abstract: not found
          • Article: not found

          Atomic Force Microscope

            Bookmark
            • Record: found
            • Abstract: not found
            • Article: not found

            Effect of contact deformations on the adhesion of particles

              Bookmark
              • Record: found
              • Abstract: not found
              • Article: not found

              SUNDIALS

                Bookmark

                Author and article information

                Contributors
                Role: Guest Editor
                Role: Guest Editor
                Journal
                Beilstein J Nanotechnol
                Beilstein J Nanotechnol
                Beilstein Journal of Nanotechnology
                Beilstein-Institut (Trakehner Str. 7-9, 60487 Frankfurt am Main, Germany )
                2190-4286
                2014
                29 October 2014
                : 5
                : 1899-1904
                Affiliations
                [1 ]Nanostructure Physics, KTH Royal Institute of Technology, Roslagstullsbacken 21, SE-106 91 Stockholm, Sweden
                [2 ]Nordita, KTH Royal Institute of Technology and Stockholm University, Roslagstullsbacken 23, SE-106 91 Stockholm, Sweden
                [3 ]Theoretical Division, Los Alamos National Laboratory, Los Alamos, NM 87545, USA
                Article
                10.3762/bjnano.5.200
                4222386
                25383301
                0134eab0-5356-4c8c-9da1-6b2bb1899d93
                Copyright © 2014, Borysov et al; licensee Beilstein-Institut.

                This is an Open Access article under the terms of the Creative Commons Attribution License ( http://creativecommons.org/licenses/by/2.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

                The license is subject to the Beilstein Journal of Nanotechnology terms and conditions: ( http://www.beilstein-journals.org/bjnano)

                History
                : 10 June 2014
                : 1 October 2014
                Categories
                Full Research Paper
                Nanoscience
                Nanotechnology

                atomic force microscopy,calibration,multimodal afm,multifrequency afm

                Comments

                Comment on this article