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Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip–surface interactions

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      Summary

      We present a theoretical framework for the dynamic calibration of the higher eigenmode parameters (stiffness and optical lever inverse responsivity) of a cantilever. The method is based on the tip–surface force reconstruction technique and does not require any prior knowledge of the eigenmode shape or the particular form of the tip–surface interaction. The calibration method proposed requires a single-point force measurement by using a multimodal drive and its accuracy is independent of the unknown physical amplitude of a higher eigenmode.

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      Atomic Force Microscope

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        Calibration of atomic-force microscope tips

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          Effect of contact deformations on the adhesion of particles

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            Author and article information

            Affiliations
            [1 ]Nanostructure Physics, KTH Royal Institute of Technology, Roslagstullsbacken 21, SE-106 91 Stockholm, Sweden
            [2 ]Nordita, KTH Royal Institute of Technology and Stockholm University, Roslagstullsbacken 23, SE-106 91 Stockholm, Sweden
            [3 ]Theoretical Division, Los Alamos National Laboratory, Los Alamos, NM 87545, USA
            Contributors
            Role: Guest Editor
            Role: Guest Editor
            Journal
            Beilstein J Nanotechnol
            Beilstein J Nanotechnol
            Beilstein Journal of Nanotechnology
            Beilstein-Institut (Trakehner Str. 7-9, 60487 Frankfurt am Main, Germany )
            2190-4286
            2014
            29 October 2014
            : 5
            : 1899-1904
            25383301 4222386 10.3762/bjnano.5.200
            Copyright © 2014, Borysov et al; licensee Beilstein-Institut.

            This is an Open Access article under the terms of the Creative Commons Attribution License ( http://creativecommons.org/licenses/by/2.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

            The license is subject to the Beilstein Journal of Nanotechnology terms and conditions: ( http://www.beilstein-journals.org/bjnano)

            Categories
            Full Research Paper
            Nanoscience
            Nanotechnology

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