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      Continuum properties from interdigital electrode dielectrometry

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          Microdielectrometry

          Stephen D. Senturia, Huan Lee, David Day … (1981)
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            In-situMeasurement of the Properties of Curing Systems with Microdielectrometry

            D. Day, S. Senturia, N. Sheppard … (2007)
            Article 0 comments Cited 14 times – based on 0 reviews     Review now
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              An MOS device for AC measurement of surface impedance with application to moisture monitoring

              S.L. Garverick, S.D. Senturia (1982)
              Article 0 comments Cited 13 times – based on 0 reviews     Review now
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                Author and article information

                Journal
                Title: IEEE Transactions on Electrical Insulation
                Abbreviated Title: IEEE Trans. Elect. Insul.
                Publisher: Institute of Electrical and Electronics Engineers (IEEE)
                ISSN (Print): 0018-9367
                Publication date Created: December 1988
                Publication date (Print): December 1988
                Volume: 23
                Issue: 6
                Pages: 897-917
                Article
                DOI: 10.1109/14.16515
                SO-VID: 0172ed49-5d2f-4a08-91ee-dda63b58230c
                Copyright © © 1988
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