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Developing efficient circularity for construction and demolition waste management in fast emerging economies: Lessons learned from Shenzhen, China
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      Desorption/ionization on silicon (DIOS) mass spectrometry: background and applications

      Author(s): , , ,
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      Journal: International Journal of Mass Spectrometry
      Publisher: Elsevier BV

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          Silicon quantum wire array fabrication by electrochemical and chemical dissolution of wafers

          L. Canham (1990)
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            The structural and luminescence properties of porous silicon

            L. Canham, P. D. J. Calcott, A G Cullis (1997)
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              Porosity and Pore Size Distributions of Porous Silicon Layers

              R. Herino (1987)
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                Author and article information

                Journal
                Title: International Journal of Mass Spectrometry
                Abbreviated Title: International Journal of Mass Spectrometry
                Publisher: Elsevier BV
                ISSN (Print): 13873806
                Publication date Created: March 2003
                Publication date (Print): March 2003
                Volume: 226
                Issue: 1
                Pages: 107-116
                Article
                DOI: 10.1016/S1387-3806(02)00973-9
                SO-VID: 1e2987e3-28bb-4f16-88a5-4ff4956ce635
                Copyright © © 2003
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                http://www.elsevier.com/tdm/userlicense/1.0/

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